ExcelonTM F-RAM™, like any other nonvolatile memory technology, is subject to physical degradation that can eventually lead to device failure if not addressed appropriately. F-RAM write/read endurance and data retention are the two end-of-life (EoL) parameters to specify its reliability and performance in a system. Learn more about the F-RAM data retention performance at various operating temperatures and find a method and guidance to accurately calculate the system’s EoL based on its operating temperature profile. Check the application note.
Slightly optimizes system costs, both hardware (some reduction in wire harness, size, space, weight) and software, without high development effort as new functionalities (ADAS, Telematics, etc.) emerge to make space in the vehicle for them. Drawback; PCB, module, and EMC design challenges as more power and logic functions are merged.
Scalable platform in performance and in cost, some software reuse for OEM and Tier1 for multiple platforms. Main drawback; high count of vehicle electronic control units (ECU) and heavy vehicle wire harness.
With Semper NOR Flash Memory Infineon provides the newest high-performance, safe, and reliable NOR Flash memory solution. Semper NOR integrates critical safety features and is the industry's first ASIL-B compliant and ASIL-D-ready NOR Flash memory.
NOR Flash Memory |
F-RAM for Automotive markets provides fast writes at full interface speed. F-RAM does not have any write delays and data is instantly nonvolatile. Traditional nonvolatile memories have delays of 5 or more milliseconds before data becomes nonvolatile. If power is disrupted, pending data is lost unless the system has extra capacitance or batteries to keep the system on until data is stored.
F-RAM offers virtually unlimited endurance of 100 trillion read/write cycles. Traditional nonvolatile memories typically have less than 1 million cycle endurance, forcing system designers to use complex wear-leveling routines and up to 4x more density to prolong the lifetime of these memories.